M.A. Plano et al., "Thickness Dependence of the Electrical Characteristics of Chemical Vapour Deposited Diamond Film". Appl. Phys. Lett. 62 (1994) 193 Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
Review of the Development of Diamond Radiation Sensors - The Rd Collaboration (Correct)
....is therefore an average over the local charge collection distances across the thickness of the sample. Successive measurements of the charge collection distance on samples which were thinned in several steps from the nucleation side show a linear increase with the removed material thickness [9]. This implies that the local charge collection distance is close to zero at the nucleation side and rises linearly to a maximum at the growth side. When a diamond sample is exposed to ionizing radiation its charge collection distance increases with the absorbed dose ( pumping ) At about 1 kRad ....
M.A. Plano et al., "Thickness Dependence of the Electrical Characteristics of Chemical Vapour Deposited Diamond Film". Appl. Phys. Lett. 62 (1994) 193
CVD Diamond Detectors for Ionizing Radiation - The Rd Collaboration (Correct)
....the pumping process is fully reversible. In this paper, all collection distance numbers are given in the pumped state. It is inherent to the inhomogeneous, columnar structure of CVD diamond that the charge collection distance is not constant throughout the detector. In fact, it has been shown [6] that the local collection distance grows linearly from zero at the substrate side towards a maximum at the growth side. The 3 value obtained by characterization is the integral mean of the local collection distances along the depth. The diamond quality has therefore been improved by initially ....
M.A. Plano et al., "Thickness Dependence of the Electrical Characteristics of Chemical Vapor Deposited Diamond Films", Appl. Phys. Lett. 64 (2) (1994) 193-195
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