Network Analyzer And Cascade Microtech Wafer Probes," RF & Microwave Measurement Symposium and Exhibition, March 1988. Home/Search Document Not in Database Summary Related Articles |
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Calibration of a Measurement System for High Frequency Nonlinear .. - Verspecht (1995) (2 citations) (Correct)
....Pisani, An Improved Calibration Technique for On Wafer Large Signal Transistor Characterization, IEEE Transactions on Instrumentation and 5.8 References 161 Measurement, Vol. 42, No. 2, pp.360 364, April 1993. 13] E. Strid, R. Gleason and K. Jones, 40GHz On Wafer Measurements With The HP 8510 Network Analyzer And Cascade Microtech Wafer Probes, RF Microwave Measurement Symposium and Exhibition, March 1988. 14] N. Balabanian, T. A. Bickart and S. Seshu, Electrical Network Theory, John Wiley Sons, Inc. Chapter6, 1969. 15] Stephen Wolfram, Mathematica A System for Doing Mathematics by Computer , Second Edition, Addison Wesley ....
Network Analyzer And Cascade Microtech Wafer Probes," RF & Microwave Measurement Symposium and Exhibition, March 1988.
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