Based On Vector Analysis of Bias-Dependent S-Parameter Data from MESFETs and HEMTs," 1992 IEEE MTT-S International Microwave Theory and Techniques Symposium Digest, pp.255-258, 1992. Home/Search Document Not in Database Summary Related Articles |
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Calibration of a Measurement System for High Frequency Nonlinear .. - Verspecht (1995) (2 citations) (Correct)
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Based On Vector Analysis of Bias-Dependent S-Parameter Data from MESFETs and HEMTs," 1992 IEEE MTT-S International Microwave Theory and Techniques Symposium Digest, pp.255-258, 1992.
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