Waveform Measurement System," IEEE Transactions on Microwave Theory and Techniques, Vol.36, No.10, pp.1397-1405, October 1988. Home/Search Document Not in Database Summary Related Articles Check |
This paper is cited in the following contexts:
Calibration of a Measurement System for High Frequency Nonlinear .. - Verspecht (1995) (2 citations) (Correct)
....reference transfer standard, the calibration procedure can be made traceable to the accuracy of the so called nose to nose calibration procedure for sampling oscilloscopes. 2.6 References 35 2. 6 References [1] Markku Sipil, Kari Lehtinen and Veikko Porra, High Frequency Periodic Time Domain Waveform Measurement System, IEEE Transactions on Microwave Theory and Techniques, Vol.36, No.10, pp.1397 1405, October 1988. 2] Urs Lott, Measurement of Magnitude and Phase of Harmonics Generated in Nonlinear Microwave Two Ports, IEEE Transactions on Microwave Theory and Techniques, Vol.37, No.10, pp.1506 1511, October ....
....Techniques, Vol.38, No.4, pp.358 365, April 1990. 5] D. Rytting, An Analysis of Vector Measurement Accuracy Enhancement Techniques, Proc. Hewlett Packard RF Microwave Symposium, pp.16 20, March 1982. 6] M. Demmler, P. J. Tasker and M. Schlechtweg, On Wafer Large Signal Power, S Parameter and Waveform Measurement System, Conference Record of the INMMC 94 Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits (Duisburg Germany) pp.153 158, October 1994. 7] J. G. Leckey, A. D. Patterson and J. A. C. Stewart, A Vector Corrected Waveform and Load Line Measurement System for ....
Waveform Measurement System," IEEE Transactions on Microwave Theory and Techniques, Vol.36, No.10, pp.1397-1405, October 1988.
Calibration of a Measurement System for High Frequency Nonlinear .. - Verspecht (1995) (2 citations) (Correct)
....Oscilloscope Mainframe Service Manual, HP Part No.54120 90908, 1989. 4] Yih Chyun Jenq, Digital Spectra of Nonuniformly Sampled Signals: A Robust Sampling Time Offset Estimation Algorithm for Ultra High Speed Waveform Digitizers Using Interleaving, IEEE Transactions on Instrumentation and Measurement, vol.IM 39, No.1, pp.71 75, Feb. 1990. 5] A. Papoulis, Probability, Random Variables, and Stochastic Processes, McGraw Hill Series in Systems Science, McGraw Hill, Inc. pp.357, 1981. 6] Fredric J. Harris, On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform, Proceedings of the IEEE, Vol. 66, No.1, ....
Measurement System Combining Network Analyzer and Sampling Oscilloscope Capabilities," IEEE Transactions on Microwave Theory and Techniques, Vol.38, No.4, pp.358-365, April 1990.
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