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Citation: Context S. Zhang, V. Wason, K. Banerjee. A probabilistic framework to estimate full-chip subthreshold leakage power distribution considering within-die and die-to-die variations. In ISLPED, 2004.
Document: DetailsA Probabilistic Model for Online Document Clustering with Application to Novelty Detection (2004) Jian Zhang, Zoubin Ghahramani, Yiming Yang