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Abstract: The test pattern generator produces test vectors that are applied to the tested circuit during pseudo-random testing of combinational circuits. The nature of the generator thus directly influences the fault coverage achieved. In this paper we discuss the influence of the type of pseudo-random pattern generator on stuck-at fault coverage. Linear feedback shift registers (LFSRs) are mostly used as test pattern generators, and the generating polynomial is primitive to ensure the maximum... (Update)
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2.2: Postgraduate Study Report DC-PSR-2004-14 - Mixed-Mode Bist Based (Correct)
1.8: Pseudorandom Testability -- Study of the Effect of the - Generator Type Petr (Correct)
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BibTeX entry: (Update)
@misc{ hana-pseudorandom,
author = "Petr Fiser Hana",
title = "Pseudorandom Testing -- A Study of the Effect of the Generator Type",
url = "citeseer.ist.psu.edu/760813.html" }
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18 How to Do Weighted Random Testing for BIST (context) - Hartmann, Kemnitz - 1993
10 Additive Cellular Automata Theory and Applications (context) - Chaudhuri - 1997
9 A BIST Pattern Generator Design for NearPerfect Fault Covera.. - Chatterjee, Pradhan - 2003
9 Column-Matching BIST Exploiting Test Don't-Cares - Fiser, Hlavi et al. - 2003
8 RT-Level ITC 99 Benchmarks and First ATPG Results - Corno, Reorda et al. - 2000
7 Atalanta: an Efficient ATPG for Combinational Circuits (context) - Lee, Ha - 1993
7 Column- Matching Based BIST Design Method - Fiser, Hlavi - 2002
6 IEEE Design & Test of Computers (context) - Agrawal, Kime et al. - 1993
6 An Efficient Mixed-Mode BIST Technique - Fiser, Kubtov - 2004
5 Synthesis Techniques for Pseudo-Random Built-In Self-Test - Touba, McCluskey - 1996
5 A Designer's Guide to Built-In Self-Test (context) - Ch - 2002
4 Influence of the Test Lengths on Area Overhead in MixedMode .. - Fiser, Kubtov - 2004
4 Vector Space Theoretic Analysis of Additive Cellular Automat.. (context) - Aloke, Chaudhuri - 1993
3 Design of a Cellular Automaton for Efficient Test Pattern Ge.. (context) - Novk, Hlavi - 1998
1 Foundations of Coding (context) - Adamek - 1991
1 Weighted Random and Pseudoexhaustive Test Patterns Generated.. (context) - Novk - 1999
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