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Pseudorandom Testability - Study of the Effect of the  (Make Corrections)  
Generator Type Petr Fiser, Hana Kubtov Czech Technical University in Prague...



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Abstract: In a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. In this paper we discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases the LFSR is used as a pattern generator, while its generating polynomial is primitive to ensure a maximal period. We show that using primitive... (Update)

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1.8:   Pseudorandom Testing -- A Study of the Effect of the Generator .. - Petr Fiser Hana   (Correct)
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BibTeX entry:   (Update)

@misc{ petr-pseudorandom,
  author = "Generator Type Petr",
  title = "Pseudorandom Testability -- Study of the Effect of the",
  url = "citeseer.ist.psu.edu/758873.html" }
Citations (may not include all citations):
171   Synthesis and Optimization of Digital Circuits (context) - De Micheli - 1994
93   Combinational Profiles of Sequential Benchmark Circuits (context) - Brglez, Bryan et al. - 1989
76   A Neutral Netlist of 10 Combinational Benchmark Circuits and.. (context) - Brglez, Fujiwara - 1985
30   Built-In Test for Circuits with Scan Based on Reseeding of M.. (context) - Hellebrand - 1995
29   Synthesis of mapping logic for generating transformed pseudo.. - Touba - 1995
19   An Efficient Forward Fault Simulation Algorithm Based on the.. (context) - Lee, Ha - 1991
18   How to Do Weighted Random Testing for BIST (context) - Hartmann, Kemnitz - 1993
9   Column-Matching BIST Exploiting Test Don't-Cares - Fiser, Hlavi et al. - 2003
9   A BIST Pattern Generator Design for Near-Perfect Fault Cover.. - Chatterjee, Pradhan - 2003
7   Atalanta: an Efficient ATPG for Combinational Circuits (context) - Lee, Ha - 1993
7   Column-Matching Based BIST Design Method - Fiser, Hlavi - 2002
6   IEEE Design & Test of Computers (context) - Agarwal, Kime et al. - 1993
6   An Efficient Mixed-Mode BIST Technique - Fiser, Kubtov - 2004
5   Synthesis Techniques for Pseudo-Random Built-In Self-Test - Touba, McCluskey - 1996
4   Vector Space Theoretic Analysis of Additive Cellular Automat.. (context) - Aloke, Chaudhuri - 1993
3   Design of a Cellular Automaton for Efficient Test Pattern Ge.. (context) - Novk, Hlavicka - 1998

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