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Abstract: Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of faults should be detected by the pseudo-random phase, to reduce the number of faults to be covered in the deterministic one. We study the properties of different pseudo-random pattern generators. Their successfulness in fault covering strictly depends on the tested circuit. We examine properties of LFSRs and cellular... (Update)
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BibTeX entry: (Update)
@misc{ bist-improvement,
author = "In Column-Matching Bist",
title = "Improvement of the Fault Coverage of the Pseudo-Random Phase",
url = "citeseer.ist.psu.edu/758740.html" }
Citations (may not include all citations):171 Synthesis and Optimization of Digital Circuits (context) - De Micheli - 1994
93 Combinational Profiles of Sequential Benchmark Circuits (context) - Brglez, Bryan et al. - 1929
76 A Neutral Netlist of 10 Combinational Benchmark Circuits and.. (context) - Brglez, Fujiwara - 1985
52 Built-In Test for VLSI: Pseudo-Random Techniques (context) - Bardell, McAnney et al. - 1987
32 A novel pattern generator for near-perfect fault coverage (context) - Chatterjee, Pradhan - 1995
32 Multiple Distributions of Biased Random Test Patterns (context) - Wunderlich - 1990
29 Synthesis of mapping logic for generating transformed pseudo.. - Touba - 1995
27 Bit-Flipping BIST - Wunderlich, Keifer - 1996
25 A New Procedure for Weighted Random Built-In-Self-Test (context) - Muradali, Agarwal et al. - 1990
23 Self Test Using Unequiprobable Random Patterns (context) - Wunderlich - 1987
18 How to Do Weighted Random Testing for BIST (context) - Hartmann, Kemnitz - 1993
10 Additive Cellular Automata Theory and Applications, Volume (context) - Chaudhuri - 1997
9 Column- Matching BIST Exploiting Test Don't-Cares - Fiser, Hlavi et al. - 2003
9 A BIST Pattern Generator Design for Near-Perfect Fault Cover.. - Chatterjee, Pradhan - 2003
8 Cellular Automata for Sequential Test Pattern Generation (context) - Chiusano, Corno et al. - 1997
7 Atalanta: an Efficient ATPG for Combinational Circuits (context) - Lee, Ha - 1993
6 An Efficient Mixed-Mode BIST Technique - Fiser, Kubtov - 2004
6 Bit-Fixing in Pseudorandom Sequences for Scan BIST - Touba, McCluskey - 2001
5 On calculating efficient LFSR seeds for built-in self test (context) - Fagot, Gascuel et al. - 1999
4 Influence of the Test Lengths on Area Overhead in Mixed-Mode.. - Fiser, Kubtov - 2004
3 Generation of Optimized Single Distributions of Weights for .. (context) - Miranda - 1993
2 A tu torial on BIST, part 1: Principles (context) - Agrawal, Kime et al. - 1993
1 Pseudorandom, Weighted Random and Pseudoexhaustive Test Patt.. (context) - Novk - 1999
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