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Abstract: Semiconductor fabrication trends indicate that emerging process technologies will experience an increase in the number of noise induced errors and device defects. While past work in fault tolerance has focused on static testing, modular redundancy in combinational logic, and error correcting codes in memories, the prevalence of transient errors may make these techniques less effective. In this project, we introduce the NanoBox, a field-programmable gate array (FPGA) style lookup table with... (Update)
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BibTeX entry: (Update)
@misc{ with-nanobox,
author = "Process Technologies With",
title = "The NanoBox: A Self-Correcting Logic Block for Emerging",
url = "citeseer.ist.psu.edu/713617.html" }
Citations (may not include all citations):106 Reliable Computer Systems: Design and Evaluation (context) - Siewiorek, Swarz - 2001
91 International technology roadmap for semiconductors (context) - Corporation - 2001
22 A defect-tolerant computer architecture: 6 Opportunities for.. (context) - Heath, Kuekes et al. - 1998
21 Nanofabrics: Spatial computing using molecular electronics - Goldstein, Budiu - 2001
6 Modeling the effect of technology trends on the soft error r.. (context) - Shivakumar, Kistler et al. - 2002
6 Single-electron majority logic circuits (context) - Iwamura, Akazawa et al. - 1998
5 Virtex-II pro platform FPGAs: Functional description (context) - Corporation - 2002
5 Issues of nanoelectronics: A possible roadmap (context) - Wang - 2002
5 The amazing vanishing transistor act (context) - Geppert - 2002
3 Self-Checking and Fault-Tolerant Digital Design (context) - Lala - 2001
1 SRC research needs document (context) - Corporation - 2002
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