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Abstract: Ion beam diagnostics are routinely used for quantitative analysis of the surface composition of mixture materials up to a depth of a few m. Unfortunately, advantageous properties of the diagnostics, like high depth resolution in combination with a large penetration depth, no destruction of the surface, high sensitivity for large as well as for small atomic numbers, and high sensitivity are mutually exclusive. Among other things, this is due to the ill-conditioned inverse problem of... (Update)
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BibTeX entry: (Update)
@misc{ toussaint-bayesian,
author = "U. V. Toussaint and R. Fischer and V. Dose",
title = "Bayesian Analysis of Ion Beam Diagnostics",
url = "citeseer.ist.psu.edu/711266.html" }
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