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Bayesian Reliability Modeling for Masked System Lifetime Data (1998)  (Make Corrections)  (1 citation)
Lynn Kuo, Tae Young Yang



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Abstract: In the masked system lifetime data, the exact component that causes the system's failure is often unknown. For each series system at test, we observe its system's failure time and a set of components that includes the component actually causing the system to fail. The objective is to make inferences for the reliability of the components. In this paper we consider various probability models for the conditional masking probabilities that identify the set of possible failed components given... (Update)

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BibTeX entry:   (Update)

Kuo, L., and Yang, T. (1998), Bayesian reliability modeling for masked system lifetime data, Technical Report tr9810, Statistics Department, University of Connecticut. http://citeseer.ist.psu.edu/article/kuo98bayesian.html   More

@misc{ kuo98bayesian,
  author = "L. Kuo and T. Yang",
  title = "Bayesian reliability modeling for masked system lifetime data",
  text = "Kuo, L., and Yang, T. (1998), Bayesian reliability modeling for masked
    system lifetime data, Technical Report tr9810, Statistics Department, University
    of Connecticut.",
  year = "1998",
  url = "citeseer.ist.psu.edu/article/kuo98bayesian.html" }
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