(Enter summary)
Abstract: In the masked system lifetime data, the exact component that causes the system's failure is often
unknown. For each series system at test, we observe its system's failure time and a set of components
that includes the component actually causing the system to fail. The objective is to make inferences for
the reliability of the components. In this paper we consider various probability models for the conditional
masking probabilities that identify the set of possible failed components given... (Update)
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Bayesian Reliability Modeling for Masked System Lifetime Data - Kuo, Yang (1998)
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BibTeX entry: (Update)
Kuo, L., and Yang, T. (1998), Bayesian reliability modeling for masked system lifetime data, Technical Report tr9810, Statistics Department, University of Connecticut. http://citeseer.ist.psu.edu/article/kuo98bayesian.html More
@misc{ kuo98bayesian,
author = "L. Kuo and T. Yang",
title = "Bayesian reliability modeling for masked system lifetime data",
text = "Kuo, L., and Yang, T. (1998), Bayesian reliability modeling for masked
system lifetime data, Technical Report tr9810, Statistics Department, University
of Connecticut.",
year = "1998",
url = "citeseer.ist.psu.edu/article/kuo98bayesian.html" }
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