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INTEGRATION, the VLSI journal 29 (2000) 131}165  (Make Corrections)  
Delay and noise estimation of CMOS logic gates driving coupled...



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Abstract: The e!ect of interconnect coupling capacitance on the transient characteristics of a CMOS logic gate strongly depends upon the signal activity. A transient analysis of CMOS logic gates driving two and three coupled resistive}capacitive interconnect lines is presented in this paper for di!erent signal combinations. Analytical expressions characterizing the output voltage and the propagation delay of a CMOS logic gate are presented for a variety of signal activity conditions. The uncertainty of... (Update)

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BibTeX entry:   (Update)

@misc{ delay-integration,
  author = "Delay And Noise",
  title = "INTEGRATION, the VLSI journal 29 (2000) 131}165",
  url = "citeseer.ist.psu.edu/613168.html" }
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