C-V and Gate Tunneling Current Characterization of Ultra-Thin Gate Oxide (1999) [2 citations — 0 self]

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@INPROCEEDINGS{Choi99c-vand,
    author = {Chang-hoon Choi and Jung-suk Goo and Tae-young Oh and Zhiping Yu and Robert W. Dutton and Amr Bayoumi and Min Cao and Paul V and E Voorde and Dieter Vook},
    title = {C-V and Gate Tunneling Current Characterization of Ultra-Thin Gate Oxide},
    booktitle = {MOS (tox=1.3-1.8 nm),” IEEE Symposium on VLSI Technology Digest of Technical Papers, pages 63 – 64},
    year = {1999}
}