(Enter summary)
Abstract: Estimating the power dissipation and the reliability of integrated circuits is a major concern
of the semiconductor industry. Previously [1], we showed that a good measure of power
dissipation and reliability is the extent of circuit switching activity, called the transition
density. However, the algorithm for computing the density in [1] is very basic and does not
take into account the effect of inertial delays of logic gates. Thus, as we will show in this
paper, the transition density may be... (Update)
Context of citations to this paper: More
...by CMOS gates. Calculating the transition densities of a circuit while taking the filtering effect into account was first described in [5]. However it became not very clear in [5] when a glitch or a short pulse would be filtered out. We will therefore look into the filtering...
...signals with a period shorter than the propagation delay of the gate. This filtering effect is due to the inertial delay of CMOS gates. In [6] this effect is already mentioned and used to come to a more accurate estimation of the transition density when not working under a zero...
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BibTeX entry: (Update)
F. Najm, "Low-pass filter for computing the transition density in digital circuits," IEEE Transactions on Computer-Aided Design, vol. 13, no. 9, pp. 1123--1131, September 1994. http://citeseer.ist.psu.edu/148706.html More
@misc{ najm94lowpass,
author = "F. Najm",
title = "Low-pass filter for computing the transition density in digital circuits",
text = "F. Najm, Low-pass filter for computing the transition density in digital
circuits, IEEE Transactions on Computer-Aided Design, vol. 13, no. 9, pp.
1123--1131, September 1994.",
year = "1994",
url = "citeseer.ist.psu.edu/148706.html" }
Citations (may not include all citations):
331
Stochastic Processes (context) - Ross - 1983
110
The Theory of Stochastic Processes (context) - Cox, Miller - 1968
98
Transition density: a new measure of activity in digital cir..
- Najm - 1993
21
NY: McGraw-Hill Book Co (context) - Papoulis, Random et al. - 1984
5
CA: Holden-Day Inc (context) - Parzen, Processes et al. - 1962
The graph only includes citing articles where the year of publication is known.
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