MetaCartSign in to MyCiteSeer

Include Citations | Advanced Search | Help

Include Citations | Advanced Search | Help

  Weighted Random Test Pattern Generation Using Genetic Alogrithms

Download:
Download as a PDF | Download as a PS
by Hiroshi Yokoyama, Kazuki Takeuchi, Xiaoquing Wen, Hideo Tamamoto
http://titan.ie.akita-u.ac.jp/~yokoyama/papers/./ftc/FTC32-94.ps.Z
Add To MetaCart

Abstract:

Abstract: In this paper, a genetic algorithm (GA) approach for the weighted random testing is discussed. Analyzing optimal weights for weighted random testing is a very complicated problem. GA is applied to obtain efficient weights for random pattern generation. Simulation results show that GA is an effective method to solve the problem. 1.

Citations

61 Multiple Distributions for Biased Random Test Patterns – Wunderlich - 1990
11 Haberl: "Generating Pseudo-Exhaustive Vectors for External Testing – Hellebrand, Wunderlich, et al. - 1990
5 Nadeau-Dostie, "A New Procedure for Weighted Random Built-In Self-Test – Muradali, Agarwal, et al. - 1990
3 Genetic algorithms implemented by wafer scale integration { wafer scale integration by LDA (leaving defects alone) approach – Yasunaga - 1994
1 Calculation of Mulitple Sets of Weights for Weighted RandomTesting – Bershteyn - 1993
1 H.Hirata, "Floorplanning by Improved Simulated Annealing Based on Genetic Algorithm – Koakutsu - 1992
1 A.Sakurai, "A Genetic Algorithm with Self-Formation Mechanism of Genotype-to-Phenotype Mapping – Takeuchi - 1993